Static Electricity Application Solution for Semiconductor Dicing Machines

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Static performance directly determines finisheddicing yield and wafer cleanliness quality for semiconductorwafer dicing. In semiconductordicing production, static charges build continuously from friction, peeling and contact interactions between wafers, thin films, carrier tapes and equipment tables, cutting blades, traction rollers and cassettes. Consequences include excessive particle counts on wafers, abnormal pickandplace after dicing, automatedequipment malfunctions and processquality deviations that undermine dicingprocess stability and wafer outgoing yield.


① Transport stage: particulate adsorption Charged wafers in dicingmachine transport zones adsorb workshopborne dust, debris and microparticle contaminants. Contaminants stick onto wafer front sides and dicing streets and resist standard cleaning operations, producing excessive frontside particle counts and abnormal streetregion particle levels. Cutting scratches and uneven kerfs ensue and degrade wafer finishedproduct yield.


② Peelingstage charge accumulation and web sticking Protectivefilm peeling constitutes a highstaticrisk process. Uneven charge distribution across wafers generates alternating electrostatic attractionrepulsion, attracts airborne microdust and modifies wafersurface mechanical loading. Dicingreferencemark accuracy suffers, leading to kerf drift and dicingthickness nonuniformity.

③ Carriertape traction: impaired feedpath precision Friction between carrier tapes and tractionguide components creates static. Electrostatic forces disrupt tension equilibrium for carriertapewafer transport and produce positional shift and misregistration. Dicingtrajectory offset yields defective dies. Staticchargedriven minor tape sticking also introduces intermittent feed stalling and hurts continuous automatedequipment throughput.


Intelligent DC static eliminators (XK-920B / XK-930B) are recommended for key stations covering highspeed wafer transport, protectivefilm peeling and carriertape traction. These units feature adjustable frequency, adjustable voltage, adjustable ionbalance performance, RS485 communication, enablecontrol signals and faultalarm functionality. They deliver precise charge neutralization adapted to stationspecific distances and operating scenarios, stabilizing static values within safe limits. Problems including excessive wafersurface particles and abnormal postdicing pickandplace are mitigated, automatedline reliable operation is secured, and waferdicing finishedproduct yield and production stability improve.

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